The Warren B. Nelms Institute for the Connected World is proud to share that Xiaolong Guo and Dr. Yier Jin are co-authors on a paper that has been awarded 2019 Best Paper Award at the Design, Automation and Test in Europe (DATE) Conference. The paper, entitled “When Capacitors Attack: Formal Method Driven Design and Detection of Charge-Domain Trojans,” represents one of the first works looking into hardware security vulnerabilities caused by analog properties in digital design. The authors (including co-authors Huifeng Zhu and Xuan Zhang from Washington University in St. Louis) defined the formal model for the analog Trojans and summarized a broad range of analog/mixed-signal threats. The authors are working towards creating mitigation solutions to counter emerging analog/mixed signal domain vulnerabilities, thereby helping to protect the global integrated circuit supply chain.

DATE is the global top conference in the Design Automation and Hardware Security areas. It is a leading international event providing unique networking opportunities, bringing together designers and design automation users, researchers and vendors, as well as specialists in hardware and software design, test and manufacturing of electronic circuits and systems.

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